Quality Assurance
Failure analysis
Device failure is the complete or partial loss of functionality, parameter drift, or intermittent occurrence of the above. Failure mode is the external macro manifestation of product failure, including open circuit, short circuit, time-to-time break, abnormal function, parameter drift, etc. According to the failure mechanism. Failure can be divided into structural failure, thermal failure, electrical failure, corrosion failure, etc. Failure analysis method:
(1) Non-destructive analysis: X-ray fluoroscopy, ultrasonic scanning inspection, electrical performance test, morphology test, local composition analysis
(2) Destructive analysis: Kaifeng inspection, profile analysis, probe test, thermal performance test, overall composition test, etc.
National sales hotline 7*24 hours
TAGORE
Mobile phone number: General Manager Office+86-19525928585/Business Manager +86-15359315036
Xiamen TAGORE Microelectronics Technology Co., Ltd. COPYRIGHT 2024
Powered by 300.cn SEO Privacy Policy
SAF Coolest v1.3.1.2 设置面板 GAGSX-AGYF-JSSVE-QXF
无数据提示
Sorry, the current column is being updated, please look forward to it!
You can view other columns or returnHome Page